tinyusb.git/examples/device/usbtest/src/usb_descriptors.c, branch worktree-ch569-hydrausb3

usbtest: skip silicon-impossible cases via bcdDevice quirk flags

2026-07-09T07:34:13Z

The CH569 USBSS ctrl_out flakiness (cases 14/21, host -EPROTO) is a silicon erratum, not a driver bug: EP0 OUT data stages whose wLength % 4 == 1 are intermittently dropped at 5 Gbps. Proven by A/B against WCH's own binary USB3 stack (SimulateCDC EVT demo patched to accept the gadget-zero 0x5b/0x5c requests), which fails identically on the same board — independent of host LPM (persists with U1/U2 disabled) and sysclk (80 vs 120 MHz). Bulk OUT at the same lengths is clean. Document the erratum in the dcd and drop the ineffective zeroed-BOS workaround. Rather than letting known-impossible cases flake the battery, the firmware now advertises quirk flags in bcdDevice bits 4-7 (tier stays in bits 0-3): 0x10 skips ctrl_out 14/21, 0x20 skips ep-halt 13 (the previously proven single-STALL limitation). usbtest.py skips flagged cases visibly at SuperSpeed only (explicit --tests still runs them) and reports them in the summary/JSON. Also fix the CH56x USB3 dcd leaving an endpoint halted across reconfiguration: clear the stalled flag in dcd_edpt_open/close/ close_all (USB 2.0 9.4.5) so a SET_CONFIGURATION recovery of a halted-then-reopened endpoint does not STALL forever. Validated on hydrausb3_v1 at 5000M: tier-4 battery x3 = 27/27 passed + 3 skipped, full HIL device suite 12/12 green (MSC 160/134 MB/s). Co-Authored-By: Claude Fable 5 Claude-Session: https://claude.ai/code/session_019MRGjBT2NBkCoWwyDT4LaE

Add SuperSpeed isochronous support to the CH56x USB3 dcd

2026-07-08T05:26:08Z

The register model comes from disassembling WCH's official USB30 device blob (libCH56x_USB30_device_lib.a): USB30_ISO_Setendp reveals per- endpoint isochronous mode bits in UEP_CFG (bit 16+ep for OUT, bit 24+ep for IN); arming and completion then use the normal endpoint flow. The usbtest example moves back to tier 4 at SuperSpeed with an iso pair in the SS descriptor set - all four kernel usbtest iso cases (15/16/22/23) pass on hardware at 5000M. The endpoint-halt latch from the previous commit is kept (it fixes usbtest case 29); case 13 is now documented as a silicon limitation after exhaustive on-hardware experiments: a halted endpoint answers exactly one probe with a STALL TP and no re-arm strategy (any NUMP, ERDY, 30 us timer re-assertion, endpoint enable bounce) revives it - no event fires per stall TP. The CH32H417's reworked endpoint engine adds a persistent RB_EP_TX_HALT mode, evidently addressing exactly this. Battery results: 30/30 at high speed, 28/30 at SuperSpeed (case 13 = silicon halt limitation; case 14 ctrl_out is intermittent - pre-existing EP0 OUT flakiness under investigation). Co-Authored-By: Claude Fable 5 Claude-Session: https://claude.ai/code/session_019MRGjBT2NBkCoWwyDT4LaE

Pass the usbtest battery on CH569 at high and SuperSpeed

2026-07-08T05:26:08Z

Running the Linux kernel usbtest/testusb battery against the CH569 for the first time. Results: 30/30 at high speed (4 consecutive reflash cycles), 25/26 at SuperSpeed. DCD fixes found by the battery: - dcd_ch56x_usbhs: clear-halt on an armed bulk-OUT pipe reset the toggle but dropped the queued receive, NAKing forever (usbtest case 29 - the same defect previously found on rp2040/fsdev/ch32_usbhs/rusb2) - dcd_ch56x_usb30: endpoint halt is now latched; the endpoint event handler used to clear the response field on every completion, wiping a just-set STALL while the peer streamed, and clear-halt now re-arms a still-armed transfer with the fresh packet sequence (cases 13/29) usbtest example gains SuperSpeed support: tier 3 on SS builds, a 4-endpoint SS descriptor set with companions, EP0 512 config and 1024-byte receive buffers. test/hil/usbtest.py gains SuperSpeed-aware case parameters: bulk sizes and vary steps must be 1024-multiples at SS or the device's whole-packet source overruns the host request (case 4 EOVERFLOW). Co-Authored-By: Claude Fable 5 Claude-Session: https://claude.ai/code/session_019MRGjBT2NBkCoWwyDT4LaE

usbtest: address code-review findings (EP3 iso regression + 9 more)

2026-07-06T04:53:40Z

Cross-checking the branch against the MCU datasheets surfaced a regression and several latent defects. Fixes (finding # from the review): #1 dcd_ch32_usbfs: restore EP3's enlarged iso buffer. CH32V20x/V30x/F20x USBFS give endpoint 3 a 1023-byte iso packet (CH32FV2x_V3xRM ch23; 16-bit R16_UEP3_T_LEN), unlike every other 64 B endpoint. Commit c05e9313e removed that buffer and capped iso at 64 B, breaking >64 B FS iso (UVC/UAC) on EP3. Re-add it via CFG_TUD_WCH_USBFS_EP3_BUFSIZE, defaulted to 1023 on those parts (CH32_USBFS_EP3_1023_BUFSIZE in ch32_usbfs_reg.h) and 64 elsewhere. #3 dcd_ch32_usbfs: make data.isochronous[] per-direction and clear it on endpoint (re)open, so a reused ep number can't inherit a stale iso response. #7 dcd_ch32_usbfs: exempt iso from the PID_OUT data-toggle handling too (was only done for PID_IN); iso is DATA0-only in both directions. #13 dcd_ch32_usbfs: bounds-assert ep < EP_MAX in dcd_edpt_iso_alloc. #2/#6 usbtest descriptors: TUD_OPT_HIGH_SPEED is a compile-time capability, not the live speed, so the full-speed config (and OTHER_SPEED) advertised int/iso mps 512 on HS boards — illegal at FS / over the 1023 B/frame iso budget. Split into FS-legal / HS descriptor sizes; the plain macro tracks operating speed. #10 vendor: non-alt free-slot detection also checks the int endpoints (a vendor interface may now be interrupt-only, no bulk ep). #14 vendor: replace the order-coupled ITF_MEM_RESET_SIZE ladder (2 unreachable branches) with offsetof(vendord_interface_t, tx_stream). #5 rp2040: clear_stall re-issue preserves the already-transferred count so a mid-transfer clear-halt reports the full length, not just the remainder. #8 rp2040: force single-buffering for iso (only BULK gets a double DPRAM buffer), so a multi-packet iso xfer can't spill buffer 1 into the next ep's DPRAM. Verified: CH32V203 usbfs and CH583 still pass usbtest tier-4 30/30; all board families build; pre-commit (format/codespell/unit) clean. Co-Authored-By: Claude Opus 4.8 Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg

usbtest: support CH32V203 (fsdev + usbfs ports), both pass tier-4 30/30

2026-07-05T15:18:21Z

Neither of the CH32V203's two USB device IPs could run the usbtest tier-4 battery. usbfs (port 1): - 128 B iso doesn't fit its fixed 64 B/ep buffers -> drop iso mps to 64 on CH32 (usb_descriptors.h). - dcd_ch32_usbfs.c: clear-halt on an armed OUT endpoint forced it to NAK, so a submitted read NAK'd forever and the host timed out. Re-assert ACK when a receive is still armed (usbtest toggle test 29). fsdev (port 0, the shared stm32_fsdev driver): - The descriptor hard-coded the interrupt mps, so USBTEST_INT_EP_MPS never took effect; all six tier-4 endpoints then overflowed the 512 B PMA and SET_CONFIG timed out. Wire the interrupt mps to the macro and use 16 on the fsdev port. - The USBD raises three IRQ lines (LP/HP/WakeUp) into one non-reentrant handler and they nest (HP preempts LP) with QingKe HWSTK enabled. The mainline toolchain's plain __attribute__((interrupt)) emits a software prologue that fights the hardware context stack and corrupts the return on nesting -> wild jump / illegal-instruction crash. Emit naked handlers that rely on HWSTK for context save/restore -- the equivalent of WCH's "WCH-Interrupt-fast", which mainline riscv-none-elf-gcc ignores -- so nesting is safe. - Single-buffered iso IN can't stay fed under load; double-buffer it (CFG_TUD_FSDEV_DOUBLE_BUFFERED_ISO_EP in the example tusb_config.h). iso mps 32 x2 = 64 B/ep keeps the same PMA budget. Left single for other fsdev parts (audio's larger iso would overflow their PMA too). Verified on nanoch32v203 (CH32V203D6): Linux testusb tier-4 (30 cases across bulk/control/interrupt/isochronous) = 30/30 on both the fsdev and usbfs variant, each across 5 reflash cycles. Full CH32V20X example set builds; cdc_msc still enumerates CDC+MSC on the fsdev port (naked-handler regression check). Drop CH32V20X from the usbtest skip list. Co-Authored-By: Claude Opus 4.8 Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg

usbtest: put iso endpoints on EP8 for nRF5x

2026-07-03T08:19:22Z

nRF5x fixes the isochronous endpoint number to 8 (EP_ISO_NUM) in hardware for both ISOOUT and ISOIN. The default tier-4 descriptor used EP3 for iso, so dcd_edpt_open() rejected it and SET_CONFIGURATION failed (can't set config, -EPIPE) - the device enumerated but never configured, so usbtest couldn't bind. Add an OPT_MCU_NRF5X case to the per-MCU endpoint-number block placing iso on EP8. usbtest on feather_nrf52840_express then configures and passes 29/30 (all bulk/int/iso/ctrl_out/halt/toggle); test 10 (queued control) hangs - a separate nRF EP0 issue tracked for follow-up. Co-Authored-By: Claude Fable 5 Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg

example(usbtest): tier 4 - isochronous source/sink (cases 15/16/22/23)

2026-07-02T15:58:39Z

Gadget-Zero parity: alt 0 carries no endpoints, alt 1 the full set (bulk + interrupt + iso IN/OUT, iso FS 128B / HS 512B). The host usbtest driver skips pipe-less altsettings and selects alt 1 itself, so no usbtest module parameters are needed. The complete 30-case battery (all four tiers) passes on stm32f407disco, stm32f723disco, stm32h743nucleo and stm32l476disco, including the ch9 case which now exercises 256 consecutive SET_INTERFACE cycles. Co-Authored-By: Claude Fable 5 Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg

example(usbtest): tier 3 - interrupt source/sink (cases 25/26)

2026-07-02T15:06:24Z

The host usbtest driver collects interrupt pipes from the same altsetting as the bulk pair, so the interface grows to 4 endpoints (hand-rolled descriptor: bulk IN/OUT + interrupt IN/OUT, FS 64B interval 1 / HS 512B interval 4) using the vendor class with CFG_TUD_VENDOR_EP_INT_OUT/IN. The interrupt pumps mirror the bulk ones: poll + re-arm from callbacks, self-healing across the halt tests. Full tier-3 battery (26 cases, now incl. 25/26 interrupt write/read) passes on stm32f407disco, stm32f723disco, stm32h743nucleo and stm32l476disco. Co-Authored-By: Claude Fable 5 Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg

example(usbtest): add device-side peer for Linux usbtest/testusb (tier 1: bulk source/sink)

2026-07-02T07:37:23Z

Vendor interface with bulk IN source / bulk OUT sink implementing the Gadget-Zero style protocol expected by the kernel usbtest driver. Non-buffered vendor mode keeps every transfer an exact packet multiple so the data-integrity cases never see an unexpected short packet, and polling pumps self-heal after the endpoint-halt cases. Tier (bulk-only for now) is advertised in bcdDevice for the host-side runner. Co-Authored-By: Claude Fable 5 Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg