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Running the Linux kernel usbtest/testusb battery against the CH569 for
the first time. Results: 30/30 at high speed (4 consecutive reflash
cycles), 25/26 at SuperSpeed.
DCD fixes found by the battery:
- dcd_ch56x_usbhs: clear-halt on an armed bulk-OUT pipe reset the toggle
but dropped the queued receive, NAKing forever (usbtest case 29 - the
same defect previously found on rp2040/fsdev/ch32_usbhs/rusb2)
- dcd_ch56x_usb30: endpoint halt is now latched; the endpoint event
handler used to clear the response field on every completion, wiping a
just-set STALL while the peer streamed, and clear-halt now re-arms a
still-armed transfer with the fresh packet sequence (cases 13/29)
usbtest example gains SuperSpeed support: tier 3 on SS builds, a
4-endpoint SS descriptor set with companions, EP0 512 config and
1024-byte receive buffers.
test/hil/usbtest.py gains SuperSpeed-aware case parameters: bulk sizes
and vary steps must be 1024-multiples at SS or the device's whole-packet
source overruns the host request (case 4 EOVERFLOW).
Co-Authored-By: Claude Fable 5 <[email protected]>
Claude-Session: https://claude.ai/code/session_019MRGjBT2NBkCoWwyDT4LaE
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overflow
Four PR-CI failures, each with a distinct root cause:
- class/vendor: mark the shared non-buffered transfer helpers TU_ATTR_UNUSED.
In buffered mode with the int/iso endpoint gates off none is referenced, and
clang (-Wunused-function -Werror) and IAR (Error[Pe177]) reject an unused
static — gcc does not, which is why only the clang/IAR matrix failed.
- bsp/ch32v20x: keep dcd_int_handler alive under LTO. The `call` sits inside
naked asm where LTO cannot see it, so -flto make builds internalized the
symbol and every ch32v20x device example failed to link (cmake has no LTO,
which masked it). A TU_ATTR_USED function-pointer reference pins it.
- usbtest: LPC11/13 (ip3511 FS) keep endpoint buffers in a dedicated 2 KB USB
RAM; the 2048 B bulk epbuf overflowed it (RamUsb2 150%) in make builds. Use
512 B (= 8 FS packets) on those parts; lpcxpresso11u37 still passes 30/30.
- test/hil: skip device/usbtest on lpcxpresso43s67 (hfp rig) — its ip3511 HS
port wedges from the first control case (1/30) and needs on-rig debugging.
Verified: make builds link for nanoch32v203 (dfu_runtime + usbtest),
lpcxpresso11u37 and lpcxpresso1347 (RamUsb2 75%); buffered-mode webusb_serial
builds; 61/61 unit tests; lpcxpresso11u37 usbtest 30/30 on hardware with the
smaller epbuf.
Co-Authored-By: Claude Fable 5 <[email protected]>
Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg
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Neither of the CH32V203's two USB device IPs could run the usbtest tier-4 battery.
usbfs (port 1):
- 128 B iso doesn't fit its fixed 64 B/ep buffers -> drop iso mps to 64 on CH32
(usb_descriptors.h).
- dcd_ch32_usbfs.c: clear-halt on an armed OUT endpoint forced it to NAK, so a
submitted read NAK'd forever and the host timed out. Re-assert ACK when a
receive is still armed (usbtest toggle test 29).
fsdev (port 0, the shared stm32_fsdev driver):
- The descriptor hard-coded the interrupt mps, so USBTEST_INT_EP_MPS never took
effect; all six tier-4 endpoints then overflowed the 512 B PMA and SET_CONFIG
timed out. Wire the interrupt mps to the macro and use 16 on the fsdev port.
- The USBD raises three IRQ lines (LP/HP/WakeUp) into one non-reentrant handler
and they nest (HP preempts LP) with QingKe HWSTK enabled. The mainline
toolchain's plain __attribute__((interrupt)) emits a software prologue that
fights the hardware context stack and corrupts the return on nesting -> wild
jump / illegal-instruction crash. Emit naked handlers that rely on HWSTK for
context save/restore -- the equivalent of WCH's "WCH-Interrupt-fast", which
mainline riscv-none-elf-gcc ignores -- so nesting is safe.
- Single-buffered iso IN can't stay fed under load; double-buffer it
(CFG_TUD_FSDEV_DOUBLE_BUFFERED_ISO_EP in the example tusb_config.h). iso mps
32 x2 = 64 B/ep keeps the same PMA budget. Left single for other fsdev parts
(audio's larger iso would overflow their PMA too).
Verified on nanoch32v203 (CH32V203D6): Linux testusb tier-4 (30 cases across
bulk/control/interrupt/isochronous) = 30/30 on both the fsdev and usbfs variant,
each across 5 reflash cycles. Full CH32V20X example set builds; cdc_msc still
enumerates CDC+MSC on the fsdev port (naked-handler regression check). Drop
CH32V20X from the usbtest skip list.
Co-Authored-By: Claude Opus 4.8 <[email protected]>
Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg
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Mirror the video_capture #if pattern: dual-mode tasks that vTaskDelay under
FreeRTOS and return under OS_NONE, a usb_device_task + freertos_init
(xTaskCreate blinky/usbd/app), and an ESP_PLATFORM app_main. Add the ESP-IDF
src/CMakeLists.txt and CFG_TUSB_OS_INC_PATH; replace the family:espressif skip
with per-MCU skips for parts that can't fit the tier-4 descriptor.
Verified: esp32s3 (FS) and esp32p4 (HS) both 30/30 on the usbtest battery.
Co-Authored-By: Claude Opus 4.8 <[email protected]>
Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg
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- example: interrupt/iso endpoint buffers track the per-speed max packet
size instead of a fixed 512, saving ~1.6 KB of USB DMA RAM on FS builds.
- test/hil/usbtest.py: re-resolve the device node after a mid-battery
re-enumeration (stale node was misreported as NOTRUN); reject an
out-of-range tier (a tier-0 device would run an empty battery and read
green); validate --tests case numbers; run cleanup in a try/finally so a
crash can't leave the dynamic id registered to hijack the next device;
guard set_pattern and the pci-reset placeholder; report a sudo-password
failure on the testusb fallback instead of a misleading NOTRUN.
- tinyusb-sudoer: allow the foreign-driver unbind path and the testusb
fallback used by the runner.
Co-Authored-By: Claude Fable 5 <[email protected]>
Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg
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Gadget-Zero parity: alt 0 carries no endpoints, alt 1 the full set (bulk
+ interrupt + iso IN/OUT, iso FS 128B / HS 512B). The host usbtest driver
skips pipe-less altsettings and selects alt 1 itself, so no usbtest
module parameters are needed.
The complete 30-case battery (all four tiers) passes on stm32f407disco,
stm32f723disco, stm32h743nucleo and stm32l476disco, including the ch9
case which now exercises 256 consecutive SET_INTERFACE cycles.
Co-Authored-By: Claude Fable 5 <[email protected]>
Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg
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The host usbtest driver collects interrupt pipes from the same altsetting
as the bulk pair, so the interface grows to 4 endpoints (hand-rolled
descriptor: bulk IN/OUT + interrupt IN/OUT, FS 64B interval 1 / HS 512B
interval 4) using the vendor class with CFG_TUD_VENDOR_EP_INT_OUT/IN. The
interrupt pumps mirror the bulk ones: poll + re-arm from callbacks,
self-healing across the halt tests.
Full tier-3 battery (26 cases, now incl. 25/26 interrupt write/read)
passes on stm32f407disco, stm32f723disco, stm32h743nucleo and
stm32l476disco.
Co-Authored-By: Claude Fable 5 <[email protected]>
Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg
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bulk source/sink)
Vendor interface with bulk IN source / bulk OUT sink implementing the
Gadget-Zero style protocol expected by the kernel usbtest driver.
Non-buffered vendor mode keeps every transfer an exact packet multiple so
the data-integrity cases never see an unexpected short packet, and polling
pumps self-heal after the endpoint-halt cases. Tier (bulk-only for now) is
advertised in bcdDevice for the host-side runner.
Co-Authored-By: Claude Fable 5 <[email protected]>
Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg
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