u-boot.git/test/dm/Makefile, branch v2015.01

dm: i2c: Add tests for I2C

2014-12-11T20:18:43Z

Add some basic tests to check that the system works as expected. Signed-off-by: Simon Glass Acked-by: Heiko Schocher

dm: sf: Add tests for SPI flash

2014-10-22T16:36:52Z

Add a simple test for SPI that uses SPI flash. It operates by creating a SPI flash file and using the 'sf test' command to test that all operations work correctly. Signed-off-by: Simon Glass Acked-by: Jagannadha Sutradharudu Teki

dm: spi: Add tests

2014-10-22T16:36:51Z

These tests use SPI flash (and the sandbox emulation) to operate. Signed-off-by: Simon Glass Acked-by: Jagannadha Sutradharudu Teki

dm: Provide a function to scan child FDT nodes

2014-07-23T13:08:36Z

At present only root nodes in the device tree are scanned for devices. But some devices can have children. For example a SPI bus may have several children for each of its chip selects. Add a function which scans subnodes and binds devices for each one. This can be used for the root node scan also, so change it. A device can call this function in its bind() or probe() methods to bind its children. Signed-off-by: Simon Glass

dm: Allow driver model tests only for sandbox

2014-06-20T17:55:52Z

The GPIO tests require the sandbox GPIO driver, so cannot be run on other platforms. Similarly for the 'dm test' command. Signed-off-by: Simon Glass

dm: Add a 'dm' command for testing

2014-03-04T17:15:29Z

This command is not required for driver model operation, but can be useful for testing. It provides simple dumps of internal data structures. Signed-off-by: Simon Glass Signed-off-by: Marek Vasut Signed-off-by: Pavel Herrmann Signed-off-by: Viktor Křivák Signed-off-by: Tomas Hlavacek

dm: Add basic tests

2014-03-04T17:15:29Z

Add some tests of driver model functionality. Coverage includes: - basic init - binding of drivers to devices using platform_data - automatic probing of devices when referenced - availability of platform data to devices - lifecycle from bind to probe to remove to unbind - renumbering within a uclass when devices are probed/removed - calling driver-defined operations - deactivation of drivers when removed - memory leak across creation and destruction of drivers/uclasses - uclass init/destroy methods - automatic probe/remove of children/parents when needed This function is enabled for sandbox, using CONFIG_DM_TEST. Signed-off-by: Simon Glass