u-boot.git/test/dm/core.c, branch v2017.09

dm: test: Add test for device removal

2017-04-05T02:15:10+00:00

Add a test for the correct device removal. Currently two different ways
for device removal are supported:

- Normal device removal via the device_remove() API
- Removal via selective device driver flags (DM_FLAG_ACTIVE_DMA)

This new test "remove_active_dma" adds tests cases for those both ways
of removal. This is done by adding a new test driver, which has this
flag set.

Signed-off-by: Stefan Roese 
Cc: Simon Glass

dm: core: Add flags parameter to device_remove()

2017-04-05T02:15:10+00:00

This patch adds the flags parameter to device_remove() and changes all
calls to this function to provide the default value of DM_REMOVE_NORMAL
for "normal" device removal.

This is in preparation for the driver specific pre-OS (e.g. DMA
cancelling) remove support.

Signed-off-by: Stefan Roese 
Cc: Simon Glass 
Acked-by: Simon Glass

test/dm/core.c: Make pre-reloc test use pre-reloc struct

2016-04-14T17:51:39+00:00

LLVM 3.5 noted:
test/dm/core.c:41:35: warning: unused variable 'test_pdata_pre_reloc' [-Wunused-const-variable]
static const struct dm_test_pdata test_pdata_pre_reloc = {

And the correct fix here is that the driver_info_pre_reloc test should
use the test_pdata_pre_reloc not test_pdata_manual variable

Cc: Simon Glass 
Signed-off-by: Tom Rini 
Reviewed-by: Simon Glass

dm: test: Show the amount of leaked memory on error

2015-10-05T14:47:49+00:00

Adjust the memory leak tests to show the amount of memory leaked. This can
be a useful signal as to what is wrong.

Signed-off-by: Simon Glass

test: Generalize the unit test framework

2015-05-21T13:16:16+00:00

Separate the ability to define tests and assert status of test functions
from the dm tests so they can be used more consistently throughout all
tests.

Signed-off-by: Joe Hershberger 
Reviewed-by: Simon Glass

dm: test: Don't clear global_data in dm_test_uclass_before_ready()

2015-04-22T17:15:36+00:00

We must not clear global_data even in tests, since the ram_buffer (which
is used by malloc()) will also be lost, and subsequent tests will fail.

Zero only the global_data fields that are required for the test to function.

Signed-off-by: Simon Glass 
Reviewed-by: Joe Hershberger 
Tested-by: Joe Hershberger

dm: test: Add tests for get/find uclass's device by name

2015-04-22T17:03:16+00:00

This commit introduces simple tests for functions:
- uclass_find_device_by_name()
- uclass_get_device_by_name()

Tests added by this commit:
- Test: dm_test_uclass_devices_find_by_name: for uclass id: UCLASS_TEST_FDT
 * get uclass's devices by uclass_find_first/next_device() each as 'testdev',
 * for each returned device, call: uclass_find_device_by_name(),
   with previously returned device's name as an argument ('testdev->name').
 * for the found device ('founddev') check if:
   * founddev != NULL
   * testdev == founddev
   * testdev->name == founddev->name (by strcmp)

- Test: dm_test_uclass_devices_get_by_name: for uclass id: UCLASS_TEST_FDT
 * get uclass's devices by uclass_get_first/next_device() each as 'testdev',
 * for each returned device, call: uclass_get_device_by_name(),
   with previously returned device's name as an argument ('testdev->name').
 * for the found device ('founddev') check if:
   * founddev != NULL
   * founddev is active
   * testdev == founddev
   * testdev->name == founddev->name (by strcmp)

Signed-off-by: Przemyslaw Marczak 
Cc: Simon Glass 
Acked-by: Simon Glass

dm: test: Add tests for get/find uclass devices

2015-04-22T17:03:14+00:00

This commit introduces simple tests for functions:
- uclass_find_first_device()
- uclass_find_next_device()
- uclass_first_device()
- uclass_next_device()

Tests added by this commit:
- Test: dm_test_uclass_devices_find:
  * call uclass_find_first_device(), then check if: (dev != NULL), (ret == 0)
  * for the rest devices, call uclass_find_next_device() and do the same check

- Test: dm_test_uclass_devices_get:
  * call uclass_first_device(), then check if:
    -- (dev != NULL), (ret == 0), device_active()
  * for the rest devices, call uclass_next_device() and do the same check

Signed-off-by: Przemyslaw Marczak 
Cc: Simon Glass 
Acked-by: Simon Glass

dm: test: Add tests for device's uclass platform data

2015-04-22T17:03:14+00:00

This test introduces new test structure type:dm_test_perdev_uc_pdata.
The structure consists of three int values only. For the test purposes,
three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1.

This commit adds two test cases for uclass platform data:
- Test: dm_test_autobind_uclass_pdata_alloc - this tests if:
  * uclass driver sets: .per_device_platdata_auto_alloc_size field
  * the devices's: dev->uclass_platdata is non-NULL

- Test: dm_test_autobind_uclass_pdata_valid - this tests:
  * if the devices's: dev->uclass_platdata is non-NULL
  * the structure of type 'dm_test_perdev_uc_pdata' allocated at address
    pointed by dev->uclass_platdata. Each structure field, should be equal
    to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1.

Signed-off-by: Przemyslaw Marczak 
Cc: Simon Glass 
Acked-by: Simon Glass

dm: core: Add a uclass pre_probe() method for devices

2015-04-17T01:27:42+00:00

Some uclasses want to set up a device before it is probed. Add a method
for this.

An example is with PCI, where a PCI uclass wants to set up its private
data for later use. This allows the device's uclass() method to make calls
whcih use that data (for example, read PCI memory regions from device
tree, set up bus numbers).

Signed-off-by: Simon Glass