u-boot.git/test/dm/core.c, branch v2018.03

dm: core: Add a function to look up a uclass by name

2018-02-03T17:08:40+00:00

Each uclass has a driver name which we can use to look up the uclass. This
is useful for logging, where the uclass ID is used as the category.

Add a function to handle this, as well as a test.

Signed-off-by: Simon Glass

dm: test: Add test for device removal

2017-04-05T02:15:10+00:00

Add a test for the correct device removal. Currently two different ways
for device removal are supported:

- Normal device removal via the device_remove() API
- Removal via selective device driver flags (DM_FLAG_ACTIVE_DMA)

This new test "remove_active_dma" adds tests cases for those both ways
of removal. This is done by adding a new test driver, which has this
flag set.

Signed-off-by: Stefan Roese 
Cc: Simon Glass

dm: core: Add flags parameter to device_remove()

2017-04-05T02:15:10+00:00

This patch adds the flags parameter to device_remove() and changes all
calls to this function to provide the default value of DM_REMOVE_NORMAL
for "normal" device removal.

This is in preparation for the driver specific pre-OS (e.g. DMA
cancelling) remove support.

Signed-off-by: Stefan Roese 
Cc: Simon Glass 
Acked-by: Simon Glass

test/dm/core.c: Make pre-reloc test use pre-reloc struct

2016-04-14T17:51:39+00:00

LLVM 3.5 noted:
test/dm/core.c:41:35: warning: unused variable 'test_pdata_pre_reloc' [-Wunused-const-variable]
static const struct dm_test_pdata test_pdata_pre_reloc = {

And the correct fix here is that the driver_info_pre_reloc test should
use the test_pdata_pre_reloc not test_pdata_manual variable

Cc: Simon Glass 
Signed-off-by: Tom Rini 
Reviewed-by: Simon Glass

dm: test: Show the amount of leaked memory on error

2015-10-05T14:47:49+00:00

Adjust the memory leak tests to show the amount of memory leaked. This can
be a useful signal as to what is wrong.

Signed-off-by: Simon Glass

test: Generalize the unit test framework

2015-05-21T13:16:16+00:00

Separate the ability to define tests and assert status of test functions
from the dm tests so they can be used more consistently throughout all
tests.

Signed-off-by: Joe Hershberger 
Reviewed-by: Simon Glass

dm: test: Don't clear global_data in dm_test_uclass_before_ready()

2015-04-22T17:15:36+00:00

We must not clear global_data even in tests, since the ram_buffer (which
is used by malloc()) will also be lost, and subsequent tests will fail.

Zero only the global_data fields that are required for the test to function.

Signed-off-by: Simon Glass 
Reviewed-by: Joe Hershberger 
Tested-by: Joe Hershberger

dm: test: Add tests for get/find uclass's device by name

2015-04-22T17:03:16+00:00

This commit introduces simple tests for functions:
- uclass_find_device_by_name()
- uclass_get_device_by_name()

Tests added by this commit:
- Test: dm_test_uclass_devices_find_by_name: for uclass id: UCLASS_TEST_FDT
 * get uclass's devices by uclass_find_first/next_device() each as 'testdev',
 * for each returned device, call: uclass_find_device_by_name(),
   with previously returned device's name as an argument ('testdev->name').
 * for the found device ('founddev') check if:
   * founddev != NULL
   * testdev == founddev
   * testdev->name == founddev->name (by strcmp)

- Test: dm_test_uclass_devices_get_by_name: for uclass id: UCLASS_TEST_FDT
 * get uclass's devices by uclass_get_first/next_device() each as 'testdev',
 * for each returned device, call: uclass_get_device_by_name(),
   with previously returned device's name as an argument ('testdev->name').
 * for the found device ('founddev') check if:
   * founddev != NULL
   * founddev is active
   * testdev == founddev
   * testdev->name == founddev->name (by strcmp)

Signed-off-by: Przemyslaw Marczak 
Cc: Simon Glass 
Acked-by: Simon Glass

dm: test: Add tests for get/find uclass devices

2015-04-22T17:03:14+00:00

This commit introduces simple tests for functions:
- uclass_find_first_device()
- uclass_find_next_device()
- uclass_first_device()
- uclass_next_device()

Tests added by this commit:
- Test: dm_test_uclass_devices_find:
  * call uclass_find_first_device(), then check if: (dev != NULL), (ret == 0)
  * for the rest devices, call uclass_find_next_device() and do the same check

- Test: dm_test_uclass_devices_get:
  * call uclass_first_device(), then check if:
    -- (dev != NULL), (ret == 0), device_active()
  * for the rest devices, call uclass_next_device() and do the same check

Signed-off-by: Przemyslaw Marczak 
Cc: Simon Glass 
Acked-by: Simon Glass

dm: test: Add tests for device's uclass platform data

2015-04-22T17:03:14+00:00

This test introduces new test structure type:dm_test_perdev_uc_pdata.
The structure consists of three int values only. For the test purposes,
three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1.

This commit adds two test cases for uclass platform data:
- Test: dm_test_autobind_uclass_pdata_alloc - this tests if:
  * uclass driver sets: .per_device_platdata_auto_alloc_size field
  * the devices's: dev->uclass_platdata is non-NULL

- Test: dm_test_autobind_uclass_pdata_valid - this tests:
  * if the devices's: dev->uclass_platdata is non-NULL
  * the structure of type 'dm_test_perdev_uc_pdata' allocated at address
    pointed by dev->uclass_platdata. Each structure field, should be equal
    to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1.

Signed-off-by: Przemyslaw Marczak 
Cc: Simon Glass 
Acked-by: Simon Glass