This adds support for partitions of the form "dev.hwpart:part" and
"dev#partname". This allows one to flash to eMMC boot partitions without
having to use CONFIG_FASTBOOT_MMC_BOOT1_SUPPORT. It also allows one to
flash to an entire device without needing CONFIG_FASTBOOT_MMC_USER_NAME.
Lastly, one can also flash MMC devices other than
CONFIG_FASTBOOT_FLASH_MMC_DEV.

Because devices can be specified explicitly, CONFIG_FASTBOOT_FLASH_MMC_DEV
is used only when necessary for existing functionality. For those cases,
fastboot_mmc_get_dev has been added as a helper function. This allows

There should be no conflicts with the existing system, but just in case, I
have ordered detection of these names after all existing names.

The fastboot_mmc_part test has been updated for these new names.

Signed-off-by: Sean Anderson <sean.anderson@seco.com>
Reviewed-by: Simon Glass <sjg@chromium.org>

This test verifies the mapping between fastboot partitions and partitions
as understood by U-Boot. It also tests the creation of GPT partitions,
though that is not the primary goal.

Signed-off-by: Sean Anderson <sean.anderson@seco.com>
Reviewed-by: Simon Glass <sjg@chromium.org>

This adds support writing to the sandbox mmc backed by an in-memory
buffer. The unit test has been updated to test reading, writing, and
erasing. I'm not sure what MMCs erase to; I picked 0, but if it's 0xFF
then that can be easily changed.

Signed-off-by: Sean Anderson <sean.anderson@seco.com>
Reviewed-by: Simon Glass <sjg@chromium.org>

- adds adc-keys button driver
- fix meson-saradc driver to get reference voltage
- add adc-keys test for sandbox
- enable adc-keys for VIM3 & VIM3L boards
- fix button.h build

By reusing DT nodes already available in sandbox's test DT introduce a
test to validate dev_phys_to_bus()/dev_bus_to_phys().

Signed-off-by: Nicolas Saenz Julienne <nsaenzjulienne@suse.de>
Reviewed-by: Simon Glass <sjg@chromium.org>
Tested-by: Peter Robinson <pbrobinson@gmail.com>
Signed-off-by: Matthias Brugger <mbrugger@suse.com>

Add test to validate dev->dma_offset is properly set on devices.

Signed-off-by: Nicolas Saenz Julienne <nsaenzjulienne@suse.de>
Reviewed-by: Simon Glass <sjg@chromium.org>
Tested-by: Peter Robinson <pbrobinson@gmail.com>
Signed-off-by: Matthias Brugger <mbrugger@suse.com>

Introduce some new nodes in sandbox's test device-tree and dm tests in
order to validate dev_get_dma_range().

Signed-off-by: Nicolas Saenz Julienne <nsaenzjulienne@suse.de>
Reviewed-by: Simon Glass <sjg@chromium.org>
Tested-by: Peter Robinson <pbrobinson@gmail.com>
Signed-off-by: Matthias Brugger <mbrugger@suse.com>

Add adc-keys device to the sandbox/test.dts and connect it to the channel
#3 of the sandbox_adc driver. The default values sampled by sandbox_adc
driver determines that button3 and button4 are released and button5 is
pressed.

Signed-off-by: Marek Szyprowski <m.szyprowski@samsung.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
Signed-off-by: Neil Armstrong <narmstrong@baylibre.com>

Extend existing DM tee tests adding test coverage for reverse RPC calls.
Currently this commit only adds tests for I2C requests from TEE driver
to TEE supplicant, for instance reading/writing data to emulated i2c
eeprom defines in standard sandbox test device tree
(arch/sandbox/dts/test.dtb):

=> i2c bus
Bus 0:	i2c@0  (active 0)
   2c: eeprom@2c, offset len 1, flags 0
   ...

Running TEE tests:
=> ut dm tee
Test: dm_test_tee: tee.c
Test: dm_test_tee: tee.c (flat tree)
Failures: 0

Signed-off-by: Igor Opaniuk <igor.opaniuk@foundries.io>
Reviewed-by: Simon Glass <sjg@chromium.org>
Acked-by: Etienne Carriere <etienne.carriere@linaro.org>

- Merge the patch to take <asm/global_data.h> out of <common.h>