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This adds a bunch of unit tests for the "fdt apply" command.
They've all been run successfully in the sandbox. However, as you still
require an out-of-tree dtc with overlay support, this is disabled by
default.
Acked-by: Simon Glass <[email protected]>
Acked-by: Pantelis Antoniou <[email protected]>
Signed-off-by: Maxime Ripard <[email protected]>
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Add a new "env" subcommand to the ut command.
This will run unit tests on the env code. This should be targetable to
any device that supports the env features needed for the tests.
Signed-off-by: Joe Hershberger <[email protected]>
Reviewed-by: Simon Glass <[email protected]>
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Make all unit tests selectable as a menu of test suites instead of just
sitting in the top-level menu individually.
Signed-off-by: Joe Hershberger <[email protected]>
Acked-by: Simon Glass <[email protected]>
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Unify the command for running unit tests further by moving the "ut_time"
command over to "ut time".
Signed-off-by: Joe Hershberger <[email protected]>
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Separate the ability to define tests and assert status of test functions
from the dm tests so they can be used more consistently throughout all
tests.
Signed-off-by: Joe Hershberger <[email protected]>
Reviewed-by: Simon Glass <[email protected]>
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Sometimes the time functions are incorrect due to bad time support on a
board. Add a unit test which tries to detect this.
Signed-off-by: Simon Glass <[email protected]>
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Add a file to control driver model test features.
Signed-off-by: Simon Glass <[email protected]>
Reviewed-by: Masahiro Yamada <[email protected]>
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