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At present only root nodes in the device tree are scanned for devices.
But some devices can have children. For example a SPI bus may have
several children for each of its chip selects.
Add a function which scans subnodes and binds devices for each one. This
can be used for the root node scan also, so change it.
A device can call this function in its bind() or probe() methods to bind
its children.
Signed-off-by: Simon Glass <[email protected]>
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The GPIO tests require the sandbox GPIO driver, so cannot be run on other
platforms. Similarly for the 'dm test' command.
Signed-off-by: Simon Glass <[email protected]>
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This command is not required for driver model operation, but can be useful
for testing. It provides simple dumps of internal data structures.
Signed-off-by: Simon Glass <[email protected]>
Signed-off-by: Marek Vasut <[email protected]>
Signed-off-by: Pavel Herrmann <[email protected]>
Signed-off-by: Viktor Křivák <[email protected]>
Signed-off-by: Tomas Hlavacek <[email protected]>
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Add some tests of driver model functionality. Coverage includes:
- basic init
- binding of drivers to devices using platform_data
- automatic probing of devices when referenced
- availability of platform data to devices
- lifecycle from bind to probe to remove to unbind
- renumbering within a uclass when devices are probed/removed
- calling driver-defined operations
- deactivation of drivers when removed
- memory leak across creation and destruction of drivers/uclasses
- uclass init/destroy methods
- automatic probe/remove of children/parents when needed
This function is enabled for sandbox, using CONFIG_DM_TEST.
Signed-off-by: Simon Glass <[email protected]>
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