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With this extended test, we get the following failure :
=> ut dm reset_base
Test: dm_test_reset_base: reset.c
test/dm/reset.c:52, dm_test_reset_base(): reset_method3.id == reset_method3_1.id: Expected 0x14 (20), got 0x2 (2)
Test: dm_test_reset_base: reset.c (flat tree)
test/dm/reset.c:52, dm_test_reset_base(): reset_method3.id == reset_method3_1.id: Expected 0x14 (20), got 0x2 (2)
Failures: 2
A fix is needed in reset_get_by_index_nodev() when introduced in [1].
[1] ea9dc35aab ("reset: Get the RESET by index without device")
Signed-off-by: Neil Armstrong <[email protected]>
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This is technically a library function, but we use MMCs for testing, so
it is easier to do it with DM. At the moment, the only block devices in
sandbox are MMCs (AFAIK) so we just test with those.
Signed-off-by: Sean Anderson <[email protected]>
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Recently, tests have been added primarily to the end of the dm Makefile.
This results in merge conflicts when two people add new tests at the
same time. To reduce these conflicts, alphabetize the makefile.
Signed-off-by: Sean Anderson <[email protected]>
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regmap_read() only fills the first two bytes of val. The last two bytes are
random data from the stack. This means the test will fail randomly.
For low endian systems we could simply initialize val to 0 and get correct
results. But tests should not depend on endianness. So let's use a pointer
conversion instead.
Signed-off-by: Heinrich Schuchardt <[email protected]>
Reviewed-by: Simon Glass <[email protected]>
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https://source.denx.de/u-boot/custodians/u-boot-ti
- Support for pinmux status command on beaglebone
- Updates for MMC speed modes for J721e-evm
- Fix MMC booting on omap35_logic_somlv board
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This adds a test case to verify reading <ranges> of a simple-bus is
working as expected.
Signed-off-by: Bin Meng <[email protected]>
Reviewed-by: Simon Glass <[email protected]>
Reviewed-by: Priyanka Jain <[email protected]>
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This adds a test case to test the new ofnode_phy_is_fixed_link() API.
Both the new and old DT bindings are covered.
Signed-off-by: Bin Meng <[email protected]>
Reviewed-by: Simon Glass <[email protected]>
Reviewed-by: Vladimir Oltean <[email protected]>
Reviewed-by: Priyanka Jain <[email protected]>
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The DSA sandbox driver is used for unit testing the DSA class code.
It implements a simple 2 port switch plus 1 CPU port, and uses a
very simple tag to identify the ports.
The DSA sandbox device is connected via CPU port to a regular Ethernet
sandbox device, called 'dsa-test-eth, managed by the existing eth
sandbox driver. The 'dsa-test-eth' is not intended for testing the
eth class code however, but it is used to emulate traffic through the
'lan0' and 'lan1' front pannel switch ports. To achieve this the dsa
sandbox driver registers a tx handler for the 'dsa-test-eth' device.
The switch ports, labeled as 'lan0' and 'lan1', are also registered
as eth devices by the dsa class code this time. So pinging through
these switch ports is as easy as:
=> setenv ethact lan0
=> ping 1.2.3.5
Unit tests for the dsa class code were also added. The 'dsa_probe'
test exercises most API functions from dsa.h. The 'dsa' unit test
simply exercises ARP/ICMP traffic through the two switch ports,
including tag injection and extraction, with the help of the dsa
sandbox driver.
I took care to minimize the impact on the existing eth unit tests,
though some adjustments needed to be made with the addition of
extra eth interfaces used by the dsa unit tests. The additional eth
interfaces also require MAC addresses, these have been added to the
sandbox default environment.
Signed-off-by: Alex Marginean <[email protected]>
Signed-off-by: Claudiu Manoil <[email protected]>
Reviewed-by: Simon Glass <[email protected]>
Signed-off-by: Vladimir Oltean <[email protected]>
Message-Id: <[email protected]>
Signed-off-by: Bin Meng <[email protected]>
Reviewed-by: Priyanka Jain <[email protected]>
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A sandbox driver and test are added for the qfw uclass, and a test in
QEMU added for qfw functionality to confirm it doesn't break in real
world use.
Signed-off-by: Asherah Connor <[email protected]>
Reviewed-by: Simon Glass <[email protected]>
Reviewed-by: Bin Meng <[email protected]>
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Add local variables agent0/agent1 to refer to SCMI sandbox context
agent and ease readability of the test.
For consistency, rename regul_dev to regul0_dev and remove sandbox_voltd
in dm_test_scmi_voltage_domains().
Signed-off-by: Etienne Carriere <[email protected]>
Reviewed-by: Simon Glass <[email protected]>
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Fix inline comments and empty line in scmi driver and test files.
Remove test on IS_ENABLED(CONFIG_*_SCMI) in test/dm/scmi.c since these
configuration are expected enabled when CONFIG_FIRMWARE_SCMI is enabled
in sandbox configuration.
Signed-off-by: Etienne Carriere <[email protected]>
Reviewed-by: Simon Glass <[email protected]>
Reviewed-by: Jaehoon Chung <[email protected]>
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Implement sandbox regulator devices for SCMI voltage domains
and test them in DM scmi tests.
Signed-off-by: Etienne Carriere <[email protected]>
Reviewed-by: Simon Glass <[email protected]>
Reviewed-by: Jaehoon Chung <[email protected]>
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The test adds two pinmux nodes to the device tree, one to test when a
register changes only one pin's mux (pinctrl-single,pins), and the other
to test when more than one pin's mux is changed (pinctrl-single,bits).
This required replacing the controller's register access functions when
the driver is used on sandbox.
Signed-off-by: Dario Binacchi <[email protected]>
Reviewed-by: Simon Glass <[email protected]>
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The PWM device provided by Chrome OS EC doesn't really support anything
other than setting a relative duty cycle. To support it as a backlight,
this patch makes the PWM period optional in the device tree and pretends
the valid brightness range is its period_ns.
Also adds a sandbox test for a PWM channel that has a fixed period,
checking that the resulting duty_cycle matches on a set_config() even if
the requested period_ns can't be set.
Signed-off-by: Alper Nebi Yasak <[email protected]>
Reviewed-by: Simon Glass <[email protected]>
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This feature was dropped from U-Boot some time ago:
f12f96cfaf5 (sf: Drop spl_flash_get_sw_write_prot")
However, we do need a way to see if a flash device is write-protected,
since if it is, it may not be possible to write to do (i.e. failing to
write is expected).
I am not sure of the correct layer to implement this, so this patch is a
stab at it. If spi-flash makes sense then I will add to the 'sf' also.
Re the points mentioned in the removal commit:
1) This kind of requirement can be achieved using existing
flash operations and flash locking API calls instead of
making a separate flash API.
Which uclass is this?
2) Technically there is no real hardware user for this API to
use in the source tree.
I do want coral (at least) to support this.
3) Having a flash operations API for simple register read bits
also make difficult to extend the flash operations.
This new patch only mentions write-protect being on or off, rather than
the actual mechanism.
4) Instead of touching generic code, it is possible to have
this functionality inside spinor operations in the form of
flash hooks or fixups for associated flash chips.
That sounds to me like what drivers are for. But we still need some sort
of API for it to be accessible.
Signed-off-by: Simon Glass <[email protected]>
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At present when driver model needs to change a device it simply updates
the struct udevice structure. But with of-platdata-inst most of the fields
are not modified at runtime. In fact, typically only the flags need to
change.
For systems running SPL from read-only memory it is convenient to separate
out the runtime information, so that the devices don't need to be copied
before being used.
Create a new udevice_rt table, similar to the existing driver_rt. For now
it just holds the flags, although they are not used in this patch.
Add a new Kconfig for the driver_rt data, since this is not needed when
of-platdata-inst is used.
Signed-off-by: Simon Glass <[email protected]>
Signed-off-by: Simon Glass <[email protected]>
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Move sandbox_spl over to use OF_PLATDATA_INST. Create a new board to
test the case when this is not enabled, since we will be keeping that
code around for several months and want to avoid regressions.
Skip the dm_test_of_plat_dev() test since driver info is not available
for OF_PLATDATA_INST.
Signed-off-by: Simon Glass <[email protected]>
Signed-off-by: Simon Glass <[email protected]>
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With recent changes this can be supported again. Add it back.
This reverts commit d85f2c4f2970d0ec2f5f075de734afd11200d153.
Signed-off-by: Simon Glass <[email protected]>
Signed-off-by: Simon Glass <[email protected]>
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This function finds a device by its driver_info index. With
of-platdata-inst we do not use driver_info, but instead instantiate
udevice records at build-time.
However the semantics of using the function are the same in each case:
the caller provides an index and gets back a device.
So rename the function to device_get_by_ofplat_idx(), so that it can be
used for both situations. The caller does not really need to worry about
the details.
Signed-off-by: Simon Glass <[email protected]>
Signed-off-by: Simon Glass <[email protected]>
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This function is now only used in a test. Drop it. Also drop
DM_DRVINFO_GET() which was the only purpose for having the function.
Signed-off-by: Simon Glass <[email protected]>
Signed-off-by: Simon Glass <[email protected]>
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Create a version of this driver for sandbox so that it can use the
of-platdata struct.
Signed-off-by: Simon Glass <[email protected]>
Signed-off-by: Simon Glass <[email protected]>
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Now that we have the alias information we can assign a sequence number
to each device in the uclass. Store this in the node associated with each
device.
This requires renaming the sandbox test drivers to have the right name.
Note that test coverage is broken with this patch, but fixed in the next
one.
Signed-off-by: Simon Glass <[email protected]>
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Some format strings use the wrong type. Fix them.
Example warnings:
In file included from test/dm/acpi.c:22:
test/dm/acpi.c: In function ‘dm_test_acpi_cmd_list’:
test/dm/acpi.c:362:21: warning: format ‘%lx’ expects argument of type
‘long unsigned int’, but argument 4 has type ‘unsigned int’ [-Wformat=]
ut_assert_nextline("RSDP %08lx %06lx (v02 U-BOOT)", addr,
^~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
sizeof(struct acpi_rsdp));
~~~~~~~~~~~~~~~~~~~~~~~~
include/test/ut.h:282:33: note: in definition of macro ‘ut_assert_nextline’
if (ut_check_console_line(uts, fmt, ##args)) { \
^~~
Signed-off-by: Simon Glass <[email protected]>
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At present SPL only runs driver model tests. Update it to run all
available tests, i.e. in any test suite.
Signed-off-by: Simon Glass <[email protected]>
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At present we use the linker list directly. This is not very friendly, so
add a helpful macro instead. This will also allow us to change the naming
later without updating this code.
Signed-off-by: Simon Glass <[email protected]>
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Add this functionality to ut_run_list() so it can be removed from
dm_test_run().
At this point all tests are run through ut_run_list().
Signed-off-by: Simon Glass <[email protected]>
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Add a check to ut_run_list() as to whether a list has driver model tests.
Move the logic for the test devicetree into that function, in an effort
to eventually remove all logic from dm_test_run().
Signed-off-by: Simon Glass <[email protected]>
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Update this function to use the return value of ut_run_list() to check for
success/failure, so that they are in sync. Also return a command success
code so that the caller gets what it expects.
Signed-off-by: Simon Glass <[email protected]>
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Use this function instead of implementing it separately for driver model.
Make ut_run_tests() private since it is only used in test-main.c
Signed-off-by: Simon Glass <[email protected]>
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At present we use a global test state for all driver-model tests. Make use
of a local struct like we do with the other tests.
To make this work, add functions to get and set this state. When a test
starts, the state is set (so it can be used in the test). When a test
finishes, the state is unset, so it cannot be used by mistake.
Signed-off-by: Simon Glass <[email protected]>
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Driver model tests are generally run twice, once with livetree enable and
again with it disabled. Add a function to handle this and call it from the
driver model test runner.
Make ut_run_test() private since it is not used outside test-main.c now.
Signed-off-by: Simon Glass <[email protected]>
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In an effort to make use of a common test runner, use ut_run_test()
directly to run driver model tests.
Signed-off-by: Simon Glass <[email protected]>
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Instead of having a separate function for running driver model tests, use
the common one. Make the pre/post-run functions private since we don't
need these outside of test-main.c
Signed-off-by: Simon Glass <[email protected]>
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Move this function into the common test runner and rename it to
dm_test_post_run() so that its purpose is clear.
Signed-off-by: Simon Glass <[email protected]>
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Move this function into test-main so that all the init is in one place.
Rename it so that its purpose is clearer.
Signed-off-by: Simon Glass <[email protected]>
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Driver model is a core part of U-Boot. We don't really need to have a
separate test structure for the driver model tests and it makes it harder
to write a test if you have to think about which type of test it is.
Subsume the fields from struct dm_test_state into struct unit_test_state
and delete the former.
Signed-off-by: Simon Glass <[email protected]>
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For driver model tests we want to reinit the data structures so that
everything is in a known state before the test runs. This avoids one test
changing something that breaks a subsequent tests.
Move the call for this into test_pre_run().
Signed-off-by: Simon Glass <[email protected]>
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This allows delays to be skipped in sandbox tests. Move it to the
common pre-init function.
Signed-off-by: Simon Glass <[email protected]>
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We already have a function for silencing the console during tests. Use
this from test_pre_run() and drop this code from the driver model tests.
Signed-off-by: Simon Glass <[email protected]>
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This is not needed now. Drop it.
Signed-off-by: Simon Glass <[email protected]>
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Move this step over to the pre-run function.
Signed-off-by: Simon Glass <[email protected]>
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Move this step over to the pre-run function.
Signed-off-by: Simon Glass <[email protected]>
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Move this step over to the pre-run function.
Signed-off-by: Simon Glass <[email protected]>
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Ultimately we want to get rid of the special driver model test init and
use test_pre_run() and test_post_run() for all tests. As a first step,
use those function to handle console recording.
For now we need a special case for setting uts->start, but that wil go
away once all init is in one place.
Signed-off-by: Simon Glass <[email protected]>
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This is the main test function for driver model but not for other tests.
Rename the file and the function so this is clear.
Signed-off-by: Simon Glass <[email protected]>
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Using the internal vs. external pull resistors it is possible to get
27 different combinations from 3 strapping pins. Add an implementation
of this.
This involves updating the sandbox GPIO driver to model external and
(weaker) internal pull resistors. The get_value() method now takes account
of what is driving a pin:
sandbox: GPIOD_EXT_DRIVEN - in which case GPIO_EXT_HIGH provides the
value
outside source - in which case GPIO_EXT_PULL_UP/DOWN indicates the
external state and we work the final state using those flags and
the internal GPIOD_PULL_UP/DOWN flags
Of course the outside source does not really exist in sandbox. We are just
modelling it for test purpose.
Signed-off-by: Simon Glass <[email protected]>
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It is convenient to be able to adjust some of the flags for a GPIO while
leaving others alone. Add a function for this.
Update dm_gpio_set_dir_flags() to make use of this.
Also update dm_gpio_set_value() to use this also, since this allows the
open-drain / open-source features to be implemented directly in the
driver, rather than using the uclass workaround.
Update the sandbox tests accordingly. This involves a lot of changes to
dm_test_gpio_opendrain_opensource() since we no-longer have the direciion
being reported differently depending on the open drain/open source flags.
Also update the STM32 drivers to let the uclass handle the active low/high
logic.
Drop the GPIOD_FLAGS_OUTPUT() macro which is no-longer used.
Signed-off-by: Simon Glass <[email protected]>
Tested-by: Kory Maincent <[email protected]>
Reviewed-by: Patrick Delaunay <[email protected]>
Tested-by: Patrick Delaunay <[email protected]>
Reviewed-by: Patrick Delaunay <[email protected]>
Tested-by: Patrick Delaunay <[email protected]>
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Adjust the terminology in this driver to reflect that fact that all flags
are handled, not just direction flags.
Create a new access function to get the full GPIO state, not just the
direction flags. Drop the static invalid_dir_flags since we can rely on a
segfault if something is wrong.
Signed-off-by: Simon Glass <[email protected]>
Reviewed-by: Patrick Delaunay <[email protected]>
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This function can be used to get any flags, not just direction flags.
Rename it to avoid confusion.
Signed-off-by: Simon Glass <[email protected]>
Reviewed-by: Patrick Delaunay <[email protected]>
Reviewed-by: Pratyush Yadav <[email protected]>
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The current method is a misnomer since it is also used (e.g. by stm32) to
update pull settings and open source/open drain.
Rename it and expand the documentation to cover a few more details.
Signed-off-by: Simon Glass <[email protected]>
Reviewed-by: Pratyush Yadav <[email protected]>
Reviewed-by: Patrick Delaunay <[email protected]>
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