1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
|
/*
* @brief Generic memory tests
* Various memory tests for testing external memory integrity. Includes
* inverse address, walking bit, and pattern tests.
*
* @note
* Copyright(C) NXP Semiconductors, 2012
* All rights reserved.
*
* @par
* Software that is described herein is for illustrative purposes only
* which provides customers with programming information regarding the
* LPC products. This software is supplied "AS IS" without any warranties of
* any kind, and NXP Semiconductors and its licensor disclaim any and
* all warranties, express or implied, including all implied warranties of
* merchantability, fitness for a particular purpose and non-infringement of
* intellectual property rights. NXP Semiconductors assumes no responsibility
* or liability for the use of the software, conveys no license or rights under any
* patent, copyright, mask work right, or any other intellectual property rights in
* or to any products. NXP Semiconductors reserves the right to make changes
* in the software without notification. NXP Semiconductors also makes no
* representation or warranty that such application will be suitable for the
* specified use without further testing or modification.
*
* @par
* Permission to use, copy, modify, and distribute this software and its
* documentation is hereby granted, under NXP Semiconductors' and its
* licensor's relevant copyrights in the software, without fee, provided that it
* is used in conjunction with NXP Semiconductors microcontrollers. This
* copyright, permission, and disclaimer notice must appear in all copies of
* this code.
*/
#ifndef __MEM_TESTS_H_
#define __MEM_TESTS_H_
#include "lpc_types.h"
/** @defgroup CHIP_Memory_Tests CHIP: Various RAM memory tests
* @ingroup CHIP_Common
* @{
*/
/**
* @brief Memory test address/size and result structure
*/
typedef struct {
uint32_t *start_addr; /*!< Starting address for memory test */
uint32_t bytes; /*!< Size in bytes for memory test */
uint32_t *fail_addr; /*!< Failed address of test (returned only if failed) */
uint32_t is_val; /*!< Failed value of test (returned only if failed) */
uint32_t ex_val; /*!< Expected value of test (returned only if failed) */
} MEM_TEST_SETUP_T;
/**
* @brief Walking 0 memory test
* @param pMemSetup : Memory test setup (and returned results)
* @return true if the test passed, or false on failure
* Writes a shifting 0 bit pattern to the entire memory range and
* verifies the result after all memory locations are written
*/
bool mem_test_walking0(MEM_TEST_SETUP_T *pMemSetup);
/**
* @brief Walking 1 memory test
* @param pMemSetup : Memory test setup (and returned results)
* @return true if the test passed, or false on failure
* Writes a shifting 1 bit pattern to the entire memory range and
* verifies the result after all memory locations are written
*/
bool mem_test_walking1(MEM_TEST_SETUP_T *pMemSetup);
/**
* @brief Address memory test
* @param pMemSetup : Memory test setup (and returned results)
* @return true if the test passed, or false on failure
* Writes the address to each memory location and verifies the
* result after all memory locations are written
*/
bool mem_test_address(MEM_TEST_SETUP_T *pMemSetup);
/**
* @brief Inverse address memory test
* @param pMemSetup : Memory test setup (and returned results)
* @return true if the test passed, or false on failure
* Writes the inverse address to each memory location and verifies the
* result after all memory locations are written
*/
bool mem_test_invaddress(MEM_TEST_SETUP_T *pMemSetup);
/**
* @brief Pattern memory test
* @param pMemSetup : Memory test setup (and returned results)
* @return true if the test passed, or false on failure
* Writes the an alternating 0x55/0xAA pattern to each memory location
* and verifies the result after all memory locations are written
*/
bool mem_test_pattern(MEM_TEST_SETUP_T *pMemSetup);
/**
* @brief Pattern memory test with seed and increment value
* @param pMemSetup : Memory test setup (and returned results)
* @param seed : Initial seed value for test
* @param incr : Increment value for each memory location
* @return true if the test passed, or false on failure
* Writes the an alternating pattern to each memory location based on a
* passed seedn and increment value and verifies the result after all
* memory locations are written
*/
bool mem_test_pattern_seed(MEM_TEST_SETUP_T *pMemSetup, uint32_t seed, uint32_t incr);
/**
* @}
*/
#endif /* __MEM_TESTS_H_ */
|
