path: root/components/drivers/serial/utest/bypass/bypass_conflict.c

/*
 * Copyright (c) 2006-2024 RT-Thread Development Team
 *
 * SPDX-License-Identifier: Apache-2.0
 *
 * Change Logs:
 * Date           Author       Notes
 * 2024-11-20     zhujiale     the first version
 * 2025-11-24     ChuanN-sudo  add standardized utest documentation block
 */

/**
 * Test Case Name: Serial Bypass Conflict Test
 *
 * Test Objectives:
 * - Validate serial device bypass mechanism under high-concurrency RX interrupt scenarios.
 * - Verify thread-safe registration/unregistration of upper and lower bypass handlers.
 * - Ensure correct data reception counting across concurrent ISR triggers and workqueue processing.
 * - Test core APIs: rt_bypass_upper_register(), rt_bypass_upper_unregister(),
 *      rt_bypass_lower_register(), rt_bypass_lower_unregister(), rt_hw_serial_isr().
 *
 * Test Scenarios:
 * - bypass_rx_stress_001: Two threads simultaneously trigger RX ISRs with upper bypass handler registered.
 *      Each thread generates 10 ISR events, expecting 200 total character receptions (10 chars per ISR × 10 ISRs × 2 threads).
 * - bypass_rx_stress_002: Concurrent ISR triggering and workqueue processing with lower bypass handler.
 *      Tests interaction between interrupt context and work queue context, expecting 100 total receptions.
 * - bypass_rx_stress_003: High-priority thread (priority 15, numerically lower = higher priority) dynamically
 *      registers/unregisters bypass handlers while low-priority thread (priority 20) continuously triggers RX ISRs.
 *
 * Verification Metrics:
 * - Character reception counter matches expected values (200 for test_001, 100 for test_002, 200 for test_003).
 * - No data loss occurs during concurrent handler registration/unregistration operations.
 * - Atomic operations ensure thread-safe counter increments without race conditions.
 * - Mock UART getc function correctly limits character generation to 10 per call sequence.
 * - System remains stable during priority inversion scenarios (priority 15 vs 20 threads).
 *
 * Dependencies:
 * - Hardware requirements: Platform with serial console device (UART) support.
 * - Software configuration:
 *     - RT_USING_UTESTCASES must be enabled (select "RT-Thread Utestcases" in menuconfig).
 *     - RT_UTEST_SERIAL_BYPASS must be enabled (enable via: RT-Thread Utestcases -> Kernel Components -> Drivers -> Serial Test -> Serial Bypass Test).
 * - Environmental Assumptions: Serial device initialized and operational before test execution.
 *
 * Expected Results:
 * - Final output: "[ PASSED ] [ result ] testcase (components.drivers.serial.bypass_rx_stress)"
 * - All atomic counter assertions pass with exact expected values.
 */

#include <rtthread.h>
#include <rtdevice.h>
#include "utest.h"

static struct rt_serial_device* _serial0;
static struct rt_spinlock lock;
static int cnt = 0;

#define __REG32(x) (*((volatile unsigned int*)((rt_ubase_t)x)))
#define UART_FR(base)   __REG32(base + 0x18)
#define UART_DR(base)   __REG32(base + 0x00)
#define UARTFR_TXFF     0x20

static rt_err_t utest_get_c(struct rt_serial_device* serial, char ch, void* data)
{
    rt_atomic_add(&cnt, 1);
    return RT_EOK;
}

static int utest_getc(struct rt_serial_device* serial)
{
    static int num = 0;

    rt_spin_lock(&lock);
    if (rt_atomic_load(&num) == 10)
    {
        rt_atomic_flag_clear(&num);
        rt_spin_unlock(&lock);
        return -1;
    }
    rt_atomic_add(&num, 1);
    rt_spin_unlock(&lock);
    return 'a';
}

struct hw_uart_device
{
    rt_size_t hw_base;
    rt_size_t irqno;
};

static int uart_putc(struct rt_serial_device* serial, char c)
{
    struct hw_uart_device* uart;

    RT_ASSERT(serial != RT_NULL);
    uart = (struct hw_uart_device*)serial->parent.user_data;

    while (UART_FR(uart->hw_base) & UARTFR_TXFF);
    UART_DR(uart->hw_base) = c;

    return 1;
}

static const struct rt_uart_ops _utest_ops =
{
    RT_NULL,
    RT_NULL,
    uart_putc,
    utest_getc,
};


static void thread_rx1(void* parameter)
{
    for (int i = 0; i < 10; i++)
    {
        rt_hw_serial_isr(_serial0, RT_SERIAL_EVENT_RX_IND);
    }
}

static void thread_rx2(void* parameter)
{
    for (int i = 0; i < 10; i++)
    {
        rt_workqueue_dowork(_serial0->bypass->lower_workq, &_serial0->bypass->work);
    }
}

static void thread_high_priority(void* parameter)
{
    for (int i = 1; i < 10; i++)
    {
        rt_bypass_upper_register(_serial0, "test", i, utest_get_c, RT_NULL);
        rt_bypass_upper_unregister(_serial0, i);
    }
}

static void thread_low_priority(void* parameter)
{
    for (int i = 0; i < 20; i++)
    {
        rt_hw_serial_isr(_serial0, RT_SERIAL_EVENT_RX_IND);
    }
}

static void bypass_rx_stress_003(void)
{
    const struct rt_uart_ops* tmp = _serial0->ops;

    rt_thread_t high = rt_thread_create("high_prio", thread_high_priority, RT_NULL, 2048, 15, 10);
    rt_thread_t low = rt_thread_create("low_prio", thread_low_priority, RT_NULL, 2048, 20, 10);

    rt_atomic_flag_clear(&cnt);
    _serial0->ops = &_utest_ops;
    rt_bypass_upper_register(_serial0, "test", 0, utest_get_c, RT_NULL);

    rt_thread_startup(high);
    rt_thread_startup(low);

    rt_thread_mdelay(1000);
    _serial0->ops = tmp;
    rt_bypass_upper_unregister(_serial0, 0);
    uassert_true(rt_atomic_load(&cnt) == 200);
}

static void bypass_rx_stress_002(void)
{
    const struct rt_uart_ops* tmp = _serial0->ops;
    rt_thread_t rx2 = rt_thread_create("rx2", thread_rx1, RT_NULL, 2048, RT_THREAD_PRIORITY_MAX - 5, 10);
    rt_thread_t rx3 = rt_thread_create("rx3", thread_rx2, RT_NULL, 2048, RT_THREAD_PRIORITY_MAX - 5, 10);

    rt_atomic_flag_clear(&cnt);
    _serial0->ops = &_utest_ops;
    rt_bypass_lower_register(_serial0, "utest", 0, utest_get_c, RT_NULL);

    rt_thread_startup(rx2);
    rt_thread_startup(rx3);

    rt_thread_mdelay(1000);

    uassert_true(rt_atomic_load(&cnt) == 100);
    _serial0->ops = tmp;
    rt_bypass_lower_unregister(_serial0, 0);
}

static void bypass_rx_stress_001(void)
{
    const struct rt_uart_ops* tmp = _serial0->ops;
    rt_thread_t rx1 = rt_thread_create("rx1", thread_rx1, RT_NULL, 2048, RT_THREAD_PRIORITY_MAX - 5, 10);
    rt_thread_t rx2 = rt_thread_create("rx1", thread_rx1, RT_NULL, 2048, RT_THREAD_PRIORITY_MAX - 5, 10);

    cnt = 0;
    _serial0->ops = &_utest_ops;
    rt_bypass_upper_register(_serial0, "utest", 0, utest_get_c, RT_NULL);

    rt_thread_startup(rx1);
    rt_thread_startup(rx2);

    rt_thread_mdelay(1000);

    uassert_true(rt_atomic_load(&cnt) == 200);
    _serial0->ops = tmp;
    rt_bypass_upper_unregister(_serial0, 0);
}

static rt_err_t utest_tc_init(void)
{
    _serial0 = (struct rt_serial_device*)rt_console_get_device();
    rt_spin_lock_init(&lock);
    return RT_EOK;
}

static rt_err_t utest_tc_cleanup(void)
{
    return RT_EOK;
}

static void _testcase(void)
{
    UTEST_UNIT_RUN(bypass_rx_stress_001);
    UTEST_UNIT_RUN(bypass_rx_stress_002);
    UTEST_UNIT_RUN(bypass_rx_stress_003);
}

UTEST_TC_EXPORT(_testcase, "components.drivers.serial.bypass_rx_stress", utest_tc_init, utest_tc_cleanup, 10);