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/*
* Copyright (c) 2006-2024 RT-Thread Development Team
*
* SPDX-License-Identifier: Apache-2.0
*
* Change Logs:
* Date Author Notes
* 2024-11-20 zhujiale the first version
* 2025-11-24 ChuanN-sudo add standardized utest documentation block
*/
/**
* Test Case Name: Serial Bypass Lower Run Test
*
* Test Objectives:
* - Validate serial device bypass lower layer registration and data processing mechanisms.
* - Verify correct character reception and callback execution in bypass mode.
* - Test core APIs: rt_bypass_lower_register(), rt_bypass_lower_unregister(), rt_hw_serial_isr()
*
* Test Scenarios:
* - Register bypass lower layer callback to intercept serial RX data before normal processing.
* - Simulate hardware interrupt with custom getc function returning predefined character sequences.
* - Verify repeated character reception, counting mechanism and sequential character reception with incremental validation.
* - Temporarily replace serial device operations with mock implementations for controlled testing.
*
* Verification Metrics:
* - Bypass callback executes for each received character with correct character value.
* - Character validation assertions pass: bypass_lower_001 validates 10 'a' characters, bypass_lower_002 validates sequential characters 'b' to 'u'.
* - Mock getc function returns -1 after 10 iterations (bypass_lower_001) or 20 iterations (bypass_lower_002) to terminate reception.
* - Serial device operations restore to original state after test completion.
* - Bypass lower layer unregisters successfully without resource leaks.
*
* Dependencies:
* - Hardware requirements: Platform with serial console device (UART) support.
* - Software configuration:
* - RT_USING_UTESTCASES must be enabled (select "RT-Thread Utestcases" in menuconfig).
* - RT_UTEST_SERIAL_BYPASS must be enabled (enable via: RT-Thread Utestcases -> Kernel Components -> Drivers -> Serial Test -> Serial Bypass Test).
* - Environmental Assumptions: Serial device initialized and operational before test execution.
*
* Expected Results:
* - Final output: "[ PASSED ] [ result ] testcase (components.drivers.serial.bypass_lower)"
* - Character validation assertions pass for all test iterations.
*/
#include <rtthread.h>
#include <rtdevice.h>
#include "utest.h"
static struct rt_serial_device* _serial0;
static int cnt = 0;
#define __REG32(x) (*((volatile unsigned int*)((rt_ubase_t)x)))
#define UART_FR(base) __REG32(base + 0x18)
#define UART_DR(base) __REG32(base + 0x00)
#define UARTFR_TXFF 0x20
struct hw_uart_device
{
rt_size_t hw_base;
rt_size_t irqno;
};
static int uart_putc(struct rt_serial_device* serial, char c)
{
struct hw_uart_device* uart;
RT_ASSERT(serial != RT_NULL);
uart = (struct hw_uart_device*)serial->parent.user_data;
while (UART_FR(uart->hw_base) & UARTFR_TXFF);
UART_DR(uart->hw_base) = c;
return 1;
}
static rt_err_t utest_lower_run_test2(struct rt_serial_device* serial, char ch, void* data)
{
static rt_uint8_t num = 0;
num++;
uassert_true(ch == ('a' + num));
return RT_EOK;
}
static int utest_getc_2(struct rt_serial_device* serial)
{
static rt_uint8_t num = 0;
if (num == 20)
return -1;
num++;
return 'a' + num;
}
static const struct rt_uart_ops _utest_ops2 =
{
RT_NULL,
RT_NULL,
uart_putc,
utest_getc_2,
};
static rt_err_t utest_lower_run(struct rt_serial_device* serial, char ch, void* data)
{
uassert_true(ch == 'a');
cnt++;
return RT_EOK;
}
static int utest_getc(struct rt_serial_device* serial)
{
static rt_uint8_t num = 0;
if (num == 10)
return -1;
num++;
return 'a';
}
static const struct rt_uart_ops _utest_ops =
{
RT_NULL,
RT_NULL,
uart_putc,
utest_getc,
};
static void bypass_lower_001(void)
{
const struct rt_uart_ops* tmp = _serial0->ops;
_serial0->ops = &_utest_ops;
rt_bypass_lower_register(_serial0, "utest", RT_BYPASS_MAX_LEVEL, utest_lower_run, RT_NULL);
rt_hw_serial_isr(_serial0, RT_SERIAL_EVENT_RX_IND);
rt_thread_mdelay(100);
uassert_true(cnt == 10);
_serial0->ops = tmp;
rt_bypass_lower_unregister(_serial0, RT_BYPASS_MAX_LEVEL);
}
static void bypass_lower_002(void)
{
const struct rt_uart_ops* tmp = _serial0->ops;
_serial0->ops = &_utest_ops2;
rt_bypass_lower_register(_serial0, "utest", RT_BYPASS_MAX_LEVEL, utest_lower_run_test2, RT_NULL);
rt_hw_serial_isr(_serial0, RT_SERIAL_EVENT_RX_IND);
rt_thread_mdelay(100);
uassert_true(cnt == 10);
_serial0->ops = tmp;
rt_bypass_lower_unregister(_serial0, RT_BYPASS_MAX_LEVEL);
}
static rt_err_t utest_tc_init(void)
{
_serial0 = (struct rt_serial_device*)rt_console_get_device();
return RT_EOK;
}
static rt_err_t utest_tc_cleanup(void)
{
return RT_EOK;
}
static void _testcase(void)
{
UTEST_UNIT_RUN(bypass_lower_001);
UTEST_UNIT_RUN(bypass_lower_002);
}
UTEST_TC_EXPORT(_testcase, "components.drivers.serial.bypass_lower", utest_tc_init, utest_tc_cleanup, 10);
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