Merge patch series "Tidy up console recording in tests"

Simon Glass <[email protected]> says:

This series started as a small fix for checking for an empty line,
but in the process several other problems were found and fixed:

- fix tests which use console recording but don't set the flag
- drop unnecessary resetting of the console in tests
- drop unnecessary blank line before MMC output
- update the docs a little
- fix buildman test failure on newer Pythons
- a few other minor things

This series also renames the confusing flag names, so that they are
easier to remember - just a UTF_ (unit-test flags) prefix.

6 files changed, 23 insertions, 22 deletions

diff --git a/include/console.h b/include/console.h
index 2617e160073..6b6d0f9de73 100644
--- a/include/console.h
+++ b/include/console.h
@@ -73,7 +73,7 @@ int console_record_reset_enable(void);
  * @str: Place to put string
  * @maxlen: Maximum length of @str including nul terminator
  * Return: length of string returned, or -ENOSPC if the console buffer was
- *	overflowed by the output
+ *	overflowed by the output, or -ENOENT if there was nothing to read
  */
 int console_record_readline(char *str, int maxlen);
 
diff --git a/include/dm/test.h b/include/dm/test.h
index 02737411a16..3cbf2c740d4 100644
--- a/include/dm/test.h
+++ b/include/dm/test.h
@@ -143,7 +143,7 @@ extern struct unit_test_state global_dm_test_state;
 
 /* Declare a new driver model test */
 #define DM_TEST(_name, _flags) \
-	UNIT_TEST(_name, UT_TESTF_DM | UT_TESTF_CONSOLE_REC | (_flags), dm_test)
+	UNIT_TEST(_name, UTF_DM | UTF_CONSOLE | (_flags), dm_test)
 
 /*
  * struct sandbox_sdl_plat - Platform data for the SDL video driver
diff --git a/include/test/log.h b/include/test/log.h
index e9028914500..e3362b85e99 100644
--- a/include/test/log.h
+++ b/include/test/log.h
@@ -13,7 +13,8 @@
 #define LOGF_TEST (BIT(LOGF_FUNC) | BIT(LOGF_MSG))
 
 /* Declare a new logging test */
-#define LOG_TEST(_name) UNIT_TEST(_name, 0, log_test)
-#define LOG_TEST_FLAGS(_name, _flags) UNIT_TEST(_name, _flags, log_test)
+#define LOG_TEST(_name) UNIT_TEST(_name, UTF_CONSOLE, log_test)
+#define LOG_TEST_FLAGS(_name, _flags) \
+		UNIT_TEST(_name, _flags | UTF_CONSOLE, log_test)
 
 #endif /* __TEST_LOG_H__ */
diff --git a/include/test/spl.h b/include/test/spl.h
index a2a5f33e328..5fd28d92706 100644
--- a/include/test/spl.h
+++ b/include/test/spl.h
@@ -154,6 +154,6 @@ SPL_TEST(func##_##type, flags)
 #define SPL_TEST_DATA_SIZE	4099
 
 /* Flags necessary for accessing DM devices */
-#define DM_FLAGS (UT_TESTF_DM | UT_TESTF_SCAN_FDT)
+#define DM_FLAGS (UTF_DM | UTF_SCAN_FDT)
 
 #endif /* TEST_SPL_H */
diff --git a/include/test/test.h b/include/test/test.h
index 838e3ce8a8f..92eec2eb6f9 100644
--- a/include/test/test.h
+++ b/include/test/test.h
@@ -24,11 +24,11 @@
  * @fdt_chksum: crc8 of the device tree contents
  * @fdt_copy: Copy of the device tree
  * @fdt_size: Size of the device-tree copy
- * @other_fdt: Buffer for the other FDT (UT_TESTF_OTHER_FDT)
- * @other_fdt_size: Size of the other FDT (UT_TESTF_OTHER_FDT)
+ * @other_fdt: Buffer for the other FDT (UTF_OTHER_FDT)
+ * @other_fdt_size: Size of the other FDT (UTF_OTHER_FDT)
  * @of_other: Live tree for the other FDT
  * @runs_per_test: Number of times to run each test (typically 1)
- * @force_run: true to run tests marked with the UT_TESTF_MANUAL flag
+ * @force_run: true to run tests marked with the UTF_MANUAL flag
  * @expect_str: Temporary string used to hold expected string value
  * @actual_str: Temporary string used to hold actual string value
  */
@@ -55,24 +55,24 @@ struct unit_test_state {
 };
 
 /* Test flags for each test */
-enum {
-	UT_TESTF_SCAN_PDATA	= BIT(0),	/* test needs platform data */
-	UT_TESTF_PROBE_TEST	= BIT(1),	/* probe test uclass */
-	UT_TESTF_SCAN_FDT	= BIT(2),	/* scan device tree */
-	UT_TESTF_FLAT_TREE	= BIT(3),	/* test needs flat DT */
-	UT_TESTF_LIVE_TREE	= BIT(4),	/* needs live device tree */
-	UT_TESTF_CONSOLE_REC	= BIT(5),	/* needs console recording */
+enum ut_flags {
+	UTF_SCAN_PDATA	= BIT(0),	/* test needs platform data */
+	UTF_PROBE_TEST	= BIT(1),	/* probe test uclass */
+	UTF_SCAN_FDT	= BIT(2),	/* scan device tree */
+	UTF_FLAT_TREE	= BIT(3),	/* test needs flat DT */
+	UTF_LIVE_TREE	= BIT(4),	/* needs live device tree */
+	UTF_CONSOLE	= BIT(5),	/* needs console recording */
 	/* do extra driver model init and uninit */
-	UT_TESTF_DM		= BIT(6),
-	UT_TESTF_OTHER_FDT	= BIT(7),	/* read in other device tree */
+	UTF_DM		= BIT(6),
+	UTF_OTHER_FDT	= BIT(7),	/* read in other device tree */
 	/*
 	 * Only run if explicitly requested with 'ut -f <suite> <test>'. The
 	 * test name must end in "_norun" so that pytest detects this also,
 	 * since it cannot access the flags.
 	 */
-	UT_TESTF_MANUAL		= BIT(8),
-	UT_TESTF_ETH_BOOTDEV	= BIT(9),	/* enable Ethernet bootdevs */
-	UT_TESTF_SF_BOOTDEV	= BIT(10),	/* enable SPI flash bootdevs */
+	UTF_MANUAL	= BIT(8),
+	UTF_ETH_BOOTDEV	= BIT(9),	/* enable Ethernet bootdevs */
+	UTF_SF_BOOTDEV	= BIT(10),	/* enable SPI flash bootdevs */
 };
 
 /**
@@ -109,7 +109,7 @@ struct unit_test {
  * @_name:	concatenation of name of the test suite, "_test_", and the name
  *		of the test
  * @_flags:	an integer field that can be evaluated by the test suite
- *		implementation
+ *		implementation (see enum ut_flags)
  * @_suite:	name of the test suite concatenated with "_test"
  */
 #define UNIT_TEST(_name, _flags, _suite)				\
diff --git a/include/test/ut.h b/include/test/ut.h
index d3172af8083..c8838dad096 100644
--- a/include/test/ut.h
+++ b/include/test/ut.h
@@ -495,7 +495,7 @@ void test_set_state(struct unit_test_state *uts);
  * @select_name: Name of a single test to run (from the list provided). If NULL
  *	then all tests are run
  * @runs_per_test: Number of times to run each test (typically 1)
- * @force_run: Run tests that are marked as manual-only (UT_TESTF_MANUAL)
+ * @force_run: Run tests that are marked as manual-only (UTF_MANUAL)
  * @test_insert: String describing a test to run after n other tests run, in the
  * format n:name where n is the number of tests to run before this one and
  * name is the name of the test to run. This is used to find which test causes